John Reffner: шукати на сайті Z-Library

Reffner, John R, Bohling, James, Keefe, Melinda

Рік:

2012

Мова:

english

Файл:

PDF, 387 KB

english, 2012

Cryo-Electron Microscopy of Latex-Pigment Composites for Enhanced Hiding in Latex Paints

Журнал:

Рік:

2014

Мова:

english

Файл:

PDF, 2.00 MB

english, 2014

Correlated Petrographic Analysis

Журнал:

Reffner, John A., Wihlborg, William T., Sweeney, M. C., Heise, Herbert M., Korte, Ernst H., Siesler, Heinz W.

Рік:

2014

Мова:

english

Файл:

PDF, 1.41 MB

english, 2014

SPIE Proceedings [SPIE Luebeck - DL tentative - Lubeck-Travemunde, Germany (Sunday 1 September 1991)] 8th Intl Conf on Fourier Transform Spectroscopy - Grazing angle microscopy: a new technique for surface analysis

Рік:

1992

Мова:

english

Файл:

PDF, 149 KB

english, 1992

SPIE Proceedings [SPIE Optical Technologies for Industrial, Environmental, and Biological Sensing - Providence, RI (Monday 27 October 2003)] Chemical and Biological Point Sensors for Homeland Defense - An FTIR point sensor for identifying chemical WMD and hazardous materials

Norman, Mark L., Gagnon, Aaron M., Reffner, John A., Schiering, David W., Allen, Jeffrey D., Sedlacek III, Arthur J., Colton, Richard, Vo-Dinh, Tuan

Рік:

2004

Мова:

english

Файл:

PDF, 236 KB

english, 2004

SPIE Proceedings [SPIE Intl Conf on Fourier and Computerized Infrared Spectroscopy - Fairfax, VA (Monday 19 June 1989)] 7th Intl Conf on Fourier Transform Spectroscopy - Reflection Spectroscopy With The FT-IR Microscope

Wihlborg, William T., Reffner, John A., Strand, Scott W., Wasacz, Frank M., Cameron, David G.

Рік:

1989

Мова:

english

Файл:

PDF, 239 KB

english, 1989

SPIE Proceedings [SPIE Optics, Electro-Optics, and Laser Applications in Science and Engineering - Los Angeles, CA (Sunday 20 January 1991)] Applied Spectroscopy in Material Science - Infrared microanalysis of contaminants at grazing incidence

Reffner, John A., Saperstein, David D.

Рік:

1991

Мова:

english

Файл:

PDF, 245 KB

english, 1991

SPIE Proceedings [SPIE Luebeck - DL tentative - Lubeck-Travemunde, Germany (Sunday 1 September 1991)] 8th Intl Conf on Fourier Transform Spectroscopy - Molecular tissue mapping by FTIR microspectroscopy

Reffner, John A., Wasacz, Frank M., Heise, Herbert M., Korte, Ernst H., Siesler, Heinz W.

Рік:

1992

Мова:

english

Файл:

PDF, 280 KB

english, 1992

SPIE Proceedings [SPIE Fourier Transform Spectroscopy: Ninth International Conference - Calgary, Canada (Monday 23 August 1993)] 9th International Conference on Fourier Transform Spectroscopy - Forensic applications of microscopical infrared internal reflection spectroscopy

Tungol, Mary W., Bartick, Edward G., Reffner, John A., Bertie, John E., Wieser, Hal

Рік:

1994

Мова:

english

Файл:

PDF, 82 KB

english, 1994

SPIE Proceedings [SPIE SPIE's 1992 Symposium on Process Control and Monitoring - Somerset, NJ (Sunday 22 March 1992)] Optically Based Methods for Process Analysis - Problem solving in pharmaceutical production using scanning infrared microprobe analysis

Reffner, John A., Bomse, David S., Brittain, Harry, Farquharson, Stuart, Lerner, Jeremy M., Rein, Alan J., Sohl, Cary, Todd, Terry R., Weyer, Lois

Рік:

1992

Мова:

english

Файл:

PDF, 510 KB

english, 1992

SPIE Proceedings [SPIE Luebeck - DL tentative - Lubeck-Travemunde, Germany (Sunday 1 September 1991)] 8th Intl Conf on Fourier Transform Spectroscopy - Design of grazing incidence and ATR objectives for FTIR microscopy

Reffner, John A., Alexay, Christopher C., Hornlein, R. W., Heise, Herbert M., Korte, Ernst H., Siesler, Heinz W.

Рік:

1992

Мова:

english

Файл:

PDF, 127 KB

english, 1992

Kinetic and thermodynamic control in conductive PP/PMMA/EAA carbon black composites

Brigandi, Paul J., Cogen, Jeffrey M., Wolf, Casey A., Reffner, John R., Pearson, Raymond A.

Журнал:

Journal of Applied Polymer Science

Рік:

2015

Мова:

english

Файл:

PDF, 1.77 MB

english, 2015

SPIE Proceedings [SPIE Fourier Transform Spectroscopy: Ninth International Conference - Calgary, Canada (Monday 23 August 1993)] 9th International Conference on Fourier Transform Spectroscopy - Spatially resolved infrared microprobe analysis of compositional gradients in polymers

Reffner, John A., Martoglio, Pamela A., Wihlborg, William T., Bertie, John E., Wieser, Hal

Рік:

1994

Мова:

english

Файл:

PDF, 154 KB

english, 1994

SPIE Proceedings [SPIE Fourier Transform Spectroscopy: Ninth International Conference - Calgary, Canada (Monday 23 August 1993)] 9th International Conference on Fourier Transform Spectroscopy - Applications of principal components analyses to multidimensional FTIR microscopy data

Ward, Kenneth J., Reffner, John A., Martoglio, Pamela A., Bertie, John E., Wieser, Hal

Рік:

1994

Мова:

english

Файл:

PDF, 184 KB

english, 1994

SPIE Proceedings [SPIE Fourier Transform Spectroscopy: Ninth International Conference - Calgary, Canada (Monday 23 August 1993)] 9th International Conference on Fourier Transform Spectroscopy - Use of infrared microspectroscopy in polarization studies of tetronic acid

Martoglio, Pamela A., Bertie, John E., Wieser, Hal, Reffner, John A., Katon, J. E.

Рік:

1993

Мова:

english

Файл:

PDF, 209 KB

english, 1993

Influence of carbon black and carbon nanotubes on the conductivity, morphology, and rheology of conductive ternary polymer blends

Brigandi, Paul J., Cogen, Jeffrey M., Reffner, John R., Wolf, Casey A., Pearson, Raymond A.

Журнал:

Polymer Engineering & Science

Рік:

2017

Мова:

english

Файл:

PDF, 1.18 MB

english, 2017

AIP Conference Proceedings [AIP The eleventh international conference on fourier transform spectroscopy - Athens, Georgia (USA) (10-15 Aug 1997)] - Synchrotron powered FT-IR microspectroscopy permits small spot ATR sampling of fiber finish and other materials

Wetzel, David L., Reffner, John A., Carr, G. Lawrence, Cho, Liling

Рік:

1998

Мова:

english

Файл:

PDF, 1.23 MB

english, 1998

AIP Conference Proceedings [AIP The eleventh international conference on fourier transform spectroscopy - Athens, Georgia (USA) (10-15 Aug 1997)] - Polyester (PET) single fiber FT-IR dichroism: Potential individualization

Cho, Liling, Wetzel, David L., Reffner, John A.

Рік:

1998

Мова:

english

Файл:

PDF, 1.69 MB

english, 1998

Correlating Surface Roughness and Binder Erosion to Tint Retention of Coatings

Eastman, Peter Y., Koback, Meghan, Gu, Junsi, Clark, Michael B., Ngunjiri, Johnpeter, Reffner, John, Valente, Cory

Журнал:

Seven, Karl M., Cogen, Jeffrey M., Person, Tim, Reffner, John R., Gilchrist, James F.

Рік:

2017

Мова:

english

Файл:

PDF, 445 KB

english, 2017

The effect of inorganic and organic nucleating agents on the electrical breakdown strength of polyethylene

Журнал:

Journal of Applied Polymer Science

Рік:

2018

Мова:

english

Файл:

PDF, 1.24 MB

english, 2018

AIP Conference Proceedings [AIP The eleventh international conference on fourier transform spectroscopy - Athens, Georgia (USA) (10-15 Aug 1997)] - Experimental confirmation of sample area definition in infrared microspectrometry

Reffner, John A., Hornlein, Robert W.

Рік:

1998

Мова:

english

Файл:

PDF, 1.03 MB

english, 1998

Microscopy Yesterday, Today and the Future

Журнал:

Рік:

1999

Мова:

english

Файл:

PDF, 8.48 MB

english, 1999

The Commercial Development of FT-IR Microspectroscopy

Журнал:

Рік:

1993

Мова:

english

Файл:

PDF, 4.17 MB

english, 1993

Molecular Microspectroscopy: Where are we and where are we going

Журнал:

Reffner, John A., Leary, Pauline E.

Рік:

1996

Мова:

english

Файл:

PDF, 3.77 MB

english, 1996

The Influence of Microspectroscopy on Evaluating and Analyzing Forensic Evidence

Журнал:

Reffner, John A., Wilks, Donald K., Schreiber, Kenneth C., Burch, Robert V.

Рік:

2006

Мова:

english

Файл:

PDF, 2.41 MB

english, 2006

Polyurea-acrylic hybrid emulsions: Characterization and film properties

Drake, Ian, Cardoen, Gregoire, Hughes, Andrew, Nakatani, Alan I., Landes, Brian, Reffner, John, Even, Ralph

Журнал:

Polymer

Рік:

2019

Мова:

english

Файл:

PDF, 2.16 MB

english, 2019

A New Approach to Infrared Microspectroscopy: Adding FT-IR to a Light Microscope

Журнал:

Reffner, John A., Kammrath, Brooke W., Kaplan, Samuel

Рік:

2002

Файл:

PDF, 183 KB

2002

A More Efficient Method for Synthetic Textile Fiber Analysis Using Polarized Light Microscopy

Журнал:

Journal of Forensic Sciences

Рік:

2019

Файл:

PDF, 685 KB

2019

Modeling and measuring the absorption-induced expansion of swellable organically modified silica

Bonvallet, Paul A., Lindner, John F., Corbin, Brian, Crow, Duncan, Reffner, Ryan, Albon Riedl, Theresa, Lehman, Susan Y., Edmiston, Paul

Журнал:

AIP Advances

Рік:

2020

Файл:

PDF, 4.95 MB

2020

Experimental Validation for Infrared Microspectroscopy (IMS)

Reffner, John A., Hornlein, Robert W., Hellgeth, John W.

Журнал: